The Latent Test is a tremendously fabulous method, which not only detects the existing defects but also the dormant ones having the possibility of becoming a permanent defect in the near future. This in turn enhances the production reliability.
Non linear Conductivity caused by a change in resistance due to the increase in current induced temperature.

In Isolation test, a sudden application of high voltage may result in burning out of parts containing Micro short and it may happen that the carbonized residue may react with water particles in the air or gases inside the factory and may cause the element to relapse as high resistance short error after the completion of the test. Our Micro-short test avoids such damage and trouble by applying a low voltage less than 30V before applying the high. Again, the high resistance short between multiple layers of a board may possess the characteristics of semiconductor and capacitors. These errors can also be detected in our test by reversing the polarity of high voltage.

EMMA series testers come standard with 250 volts. All EMMA units are field up-gradable to 500 volts or 1000 volts. 500 volt measuring unit is adjustable in 1-volt increments and 1000 volt one is adjustable in 4-volt increments.

If HIPOT meter is installed to ELX6146 through GPIB interface, application of high voltage, as much as 5000 volt, is feasible.